Invention for Machine learning wafer defect inspection
Invented by Chung-Pin CHOU, Sheng-Wen Huang, Jun-Xiu Liu, Taiwan Semiconductor Manufacturing Co TSMC Ltd The market for machine learning wafer…
Read MoreInvented by Chung-Pin CHOU, Sheng-Wen Huang, Jun-Xiu Liu, Taiwan Semiconductor Manufacturing Co TSMC Ltd The market for machine learning wafer…
Read MoreInvented by Vikram Chandrasekhar, Yongseok Park, Shan Jin, Pranav Madadi, Eric Johnson, Jianzhong Zhang, Russell Ford, Samsung Electronics Co Ltd…
Read MoreInvented by Nicholas Edward Gillian, Jaime Lien, Patrick M. Amihood, Ivan Poupyrev, Google LLC The market for user-customizable machine learning…
Read MoreInvented by Austin Walters, Jeremy Goodsitt, Vincent Pham, Capital One Services LLC The market for System and Method for Efficient…
Read MoreInvented by Marat KHANDROS, Amirreza OGHBAEE, Ali Syed, Kamran PIRASTEH, Weitao LIN, Alexander Michael KRUSH, Jacob Alexander ABBOTT, Royal Bank…
Read MoreInvented by Nathan Wiebe, Krysta Svore, Ashish Kapoor, Microsoft Technology Licensing LLC Quantum deep learning is a relatively new field…
Read MoreInvented by Wilka Carvalho, Bryant Chen, Benjamin J. Edwards, Taesung Lee, Ian M. Molloy, Jialong Zhang, International Business Machines Corp…
Read MoreInvented by Katelyn Rose Nye, Gireesha Rao, General Electric Co The market for systems and methods for delivering point-of-care alerts…
Read MoreInvented by Charles Howard Cella, Gerald William Duffy, JR., Jeffrey P. McGuckin, Mehul Desai, Strong Force IoT Portfolio 2016 LLC…
Read MoreInvented by Buddy Aswin, US Department of Navy Machine vision systems have become increasingly popular in recent years, and with…
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